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High-Resolution Atomic Force Microscopy of DNA

D. V. Klinov*, T. V. Neretina, V. V. Prokhorov, T. V. Dobrynina, K. G. Aldarov, and V. V. Demin

Shemyakin–Ovchinnikov Institute of Bioorganic Chemistry, Russian Academy of Sciences, ul. Miklukho-Maklaya 16/10, 117997 Moscow, Russia; E-mail: klinov@ibch.ru

* To whom correspondence should be addressed.

Received September 30, 2008; Revision received November 16, 2008
A method using high resolution atomic force microscopy for imaging DNA has been elaborated. Using super-sharp probes and modified graphite as support for molecule adsorption, DNA molecule images were obtained whose resolution made possible the observation of their fine structure with repeated helical motifs. The method can be used to visualize individual spread molecules of single-stranded DNA.
KEY WORDS: AFM, high resolution, DNA, scanning probes, HOPG

DOI: 10.1134/S0006297909100113